DR YIELD, specialist for Big Data in the semiconductor industry, will be showcasing its latest version of YieldWatchDog™ at the apc|m conference in Rome, Italy.
GRAZ, Austria -
(EINPresswire via NewMediaWire) - March 25, 2014 - The DR YIELD team will exhibit their yield software solution for three days at the apc|m conference in Rome, which takes place in the NH Leonardo da Vinci Hotel from 7 – 9 April 2014. “The semiconductor industry is now looking for the right tools for Big Data analytics – at the apc|m conference we can show to a distinguished technical audience what solutions we offer,” says Dieter Rathei, CEO of DR YIELD.
Full product information, including the product video can be found at http://www.dryield.com/More information about the conference can be found at http://www.apcm-europe.eu/home.html
About DR YIELD
DR YIELD is the technology leader in dealing with Big Data for the semiconductor industry and other high tech industries. It serves customers worldwide as an innovative provider of next-generation software for yield control. The patented software solution YieldWatchDog™ enables monitoring of all manufacturing data and allows early detection of potential production problems at an unprecedented level of thoroughness. Thus, costly yield excursions can be avoided due to early notifications.
Contact:
DR YIELD software & solutions GmbH
Opernring 4
8010 Graz
AUSTRIA
+43 316 225 7140
contact@dryield.com
www.dryield.com
Daniela Pechtigam
DR YIELD software & solutions GmbH
+43 316 225 7140